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adc_sar_spec.yaml.bak
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adc_sar_spec.yaml.bak
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#temperature
temp: 300
temp_min: 273
temp_max: 400
#input range
v_in: 0.3
v_in_max: 0.5
v_in_cm: 0.21
#number of bits
n_bit: 6
#number of bits after cal
n_bit_cal: 5
#effective sampling rate
fsamp: 2.0e+9
#interleaving ratio
n_interleave: 4
#minimum cap size (set by process and template)
c_unit: 0.205e-15
#ground cap size (for noise calculations)
c_ground: 0.250e-15
#Max. cap mismatch ratio for c_unit
c_delta: 0.5
#stardard deviation of sampling noise in bits
n_bit_samp_noise: 0.5
#max. sampling settling error in bits
n_bit_samp_settle: 0.5
#sigma of comparator noise in bits
n_bit_comp_noise: 1
#capdac radix array
rdx_array: [1, 2, 4, 8, 16]
#enob from redundancy
rdx_enob: 5
#timing budget
cycle_comp: 0.25
cycle_logic: 0.4
cycle_dac: 0.25
#voltage - vdd
vdd: 0.8
vdd_min: 0.72
vdd_max: 0.88
#True if laygo is used for sampler generation. If false, AnalogBase is used
samp_use_laygo: True