Cxl.v5 #100
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Cxl.v5 #100
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Move some PCIE spec definitions from pcie_ide.c to pcie.h because these definitions will be used in cxl as well. Signed-off-by: Min Xu <min.m.xu@intel.com>
Add CXL.memcache related definition in intel_keyp.h. These definitions are Intel specific. Signed-off-by: Min Xu <min.m.xu@intel.com>
Signed-off-by: Min Xu <min.m.xu@intel.com>
Signed-off-by: Min Xu <min.m.xu@intel.com>
Signed-off-by: Min Xu <min.m.xu@intel.com>
Signed-off-by: Min Xu <min.m.xu@intel.com>
Signed-off-by: Min Xu <min.m.xu@intel.com>
The major changes of this patch are:
1. Move the test case/config/group funcs from pcie_ide_test_lib.h.
Instead pcie_ide_test_lib_register_funcs is added. This function is
called to register the pcie_ide_test_lib test case/config/group
funcs. The benifinit is that if some more funcs are to be added, it
only need to update the codes in pcie_ide_test_lib.
2. pcie_ide_test_lib_get_test_case_names is to get the supported test case
names of pcie_ide_test_lib.
3. pcie_ide_test_lib_get_config_bitmask is to get the supported config
bitmask.
Signed-off-by: Min Xu <min.m.xu@intel.com>
The major changes are: 1. Add device_pcie_read/write_16 and mmio_read/write 64. They are required in CXL.memcache. 2. Add test_catetory helper functions. 3. OFFSET_OF is to get the offset of a field in a struct. Signed-off-by: Min Xu <min.m.xu@intel.com>
test_factory has below major funcs: 1. test_factory_init/test_factory_close In test_factory_init() it calls xxx_test_lib_register_funcs to register test related functions. In the future if TDISP is to be enabled, TDISP test lib shall implement its register func and be called in test_factory_init(). 2. test_factory_get_test_group_funcs test_factory_get_test_config_funcs test_factory_get_test_case_funcs These 3 functions are to get the test group/config/case funcs. 3. test_factory_get_config_bitmask This function is to get the config_bitmask of PCIE-IDE/CXL-IDE. Signed-off-by: Min Xu <min.m.xu@intel.com>
Signed-off-by: Min Xu <min.m.xu@intel.com>
The major changes are: 1. Update cmdline.c to support test_catetory (pcie or cxl.mem) 2. Update ide_test_ini.c to support test_category field in TestSuite section. 3. Update ide_test.c to support test_category. 4. Call test_factory_init/test_factory_close in teeio_validator.c. Signed-off-by: Min Xu <min.m.xu@intel.com>
Signed-off-by: Min Xu <min.m.xu@intel.com>
Signed-off-by: Min Xu <min.m.xu@intel.com>
jyao1
reviewed
Jul 5, 2024
| (MAX(MAX_QUERY_CASE_ID, MAX(MAX_KEYPROG_CASE_ID, MAX(MAX_KSETGO_CASE_ID, MAX(MAX_KSETSTOP_CASE_ID, MAX(MAX_SPDMSESSION_CASE_ID, MAX_FULL_CASE_ID)))))) | ||
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| #define MAX_CXL_QUERY_CASE_ID 2 |
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Please separate to a standalone file. Dont change this file.
Signed-off-by: Min Xu <min.m.xu@intel.com>
Signed-off-by: Min Xu <min.m.xu@intel.com>
Signed-off-by: Min Xu <min.m.xu@intel.com>
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Updated with cxl.v6 |
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