Skip to content
New issue

Have a question about this project? Sign up for a free GitHub account to open an issue and contact its maintainers and the community.

By clicking “Sign up for GitHub”, you agree to our terms of service and privacy statement. We’ll occasionally send you account related emails.

Already on GitHub? Sign in to your account

Add more I/O read tests #14

Open
wants to merge 1 commit into
base: master
Choose a base branch
from
Open

Conversation

KellanClark
Copy link

Tests for almost every non-serial I/O register between 0x4000100 and 0x4000160 along with DISPCNT, Green Swap, SOUNDBIAS, WAITCNT, and IME.
Be warned the DISPCNT and Green Swap tests cause a little flickering when looking at their results. I am 100% open to feedback on anything to remove or change.
All results verified on a 3DS.

@endrift
Copy link
Member

endrift commented Jan 31, 2022

I have an (unpushed) commit that adds many of these, but individual tests for dozens of registers that don't exist is more or less fluff and not actually useful. That said, for flickering reasons, the display registers are absent, and for "I'm not sure if this will break things", the timer and IRQ registers are absent too.

Sign up for free to join this conversation on GitHub. Already have an account? Sign in to comment
Labels
None yet
Projects
None yet
Development

Successfully merging this pull request may close these issues.

2 participants