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Use higher root circuit degree for SuperCircuit
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@ed255
ed255 committed Jun 16, 2023
1 parent 3ab7ee4 commit 93dddd2
Showing 1 changed file with 24 additions and 23 deletions.
47 changes: 24 additions & 23 deletions integration-tests/src/integration_test_circuits.rs
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Original file line number Diff line number Diff line change
Expand Up @@ -82,7 +82,9 @@ const KECCAK_CIRCUIT_DEGREE: u32 = 16;
const SUPER_CIRCUIT_DEGREE: u32 = 20;
const EXP_CIRCUIT_DEGREE: u32 = 16;
const PI_CIRCUIT_DEGREE: u32 = 17;
const ROOT_CIRCUIT_DEGREE: u32 = 24;
const ROOT_CIRCUIT_SMALL_DEGREE: u32 = 24;
// Big is for SuperCircuit only
const ROOT_CIRCUIT_BIG_DEGREE: u32 = 26;

lazy_static! {
/// Data generation.
Expand All @@ -100,39 +102,39 @@ lazy_static! {
lazy_static! {
/// Integration test for EVM circuit
pub static ref EVM_CIRCUIT_TEST: TokioMutex<IntegrationTest<TestEvmCircuit<Fr>>> =
TokioMutex::new(IntegrationTest::new("EVM", EVM_CIRCUIT_DEGREE));
TokioMutex::new(IntegrationTest::new("EVM", EVM_CIRCUIT_DEGREE, ROOT_CIRCUIT_SMALL_DEGREE));

/// Integration test for State circuit
pub static ref STATE_CIRCUIT_TEST: TokioMutex<IntegrationTest<TestStateCircuit<Fr>>> =
TokioMutex::new(IntegrationTest::new("State", STATE_CIRCUIT_DEGREE));
TokioMutex::new(IntegrationTest::new("State", STATE_CIRCUIT_DEGREE, ROOT_CIRCUIT_SMALL_DEGREE));

/// Integration test for State circuit
pub static ref TX_CIRCUIT_TEST: TokioMutex<IntegrationTest<TestTxCircuit<Fr>>> =
TokioMutex::new(IntegrationTest::new("Tx", TX_CIRCUIT_DEGREE));
TokioMutex::new(IntegrationTest::new("Tx", TX_CIRCUIT_DEGREE, ROOT_CIRCUIT_SMALL_DEGREE));

/// Integration test for Bytecode circuit
pub static ref BYTECODE_CIRCUIT_TEST: TokioMutex<IntegrationTest<TestBytecodeCircuit<Fr>>> =
TokioMutex::new(IntegrationTest::new("Bytecode", BYTECODE_CIRCUIT_DEGREE));
TokioMutex::new(IntegrationTest::new("Bytecode", BYTECODE_CIRCUIT_DEGREE, ROOT_CIRCUIT_SMALL_DEGREE));

/// Integration test for Copy circuit
pub static ref COPY_CIRCUIT_TEST: TokioMutex<IntegrationTest<TestCopyCircuit<Fr>>> =
TokioMutex::new(IntegrationTest::new("Copy", COPY_CIRCUIT_DEGREE));
TokioMutex::new(IntegrationTest::new("Copy", COPY_CIRCUIT_DEGREE, ROOT_CIRCUIT_SMALL_DEGREE));

/// Integration test for Keccak circuit
pub static ref KECCAK_CIRCUIT_TEST: TokioMutex<IntegrationTest<TestKeccakCircuit<Fr>>> =
TokioMutex::new(IntegrationTest::new("Keccak", KECCAK_CIRCUIT_DEGREE));
TokioMutex::new(IntegrationTest::new("Keccak", KECCAK_CIRCUIT_DEGREE, ROOT_CIRCUIT_SMALL_DEGREE));

/// Integration test for Copy circuit
pub static ref SUPER_CIRCUIT_TEST: TokioMutex<IntegrationTest<SuperCircuit::<Fr>>> =
TokioMutex::new(IntegrationTest::new("Super", SUPER_CIRCUIT_DEGREE));
TokioMutex::new(IntegrationTest::new("Super", SUPER_CIRCUIT_DEGREE, ROOT_CIRCUIT_BIG_DEGREE));

/// Integration test for Exp circuit
pub static ref EXP_CIRCUIT_TEST: TokioMutex<IntegrationTest<TestExpCircuit::<Fr>>> =
TokioMutex::new(IntegrationTest::new("Exp", EXP_CIRCUIT_DEGREE));
/// Integration test for Exp circuit
pub static ref EXP_CIRCUIT_TEST: TokioMutex<IntegrationTest<TestExpCircuit::<Fr>>> =
TokioMutex::new(IntegrationTest::new("Exp", EXP_CIRCUIT_DEGREE, ROOT_CIRCUIT_SMALL_DEGREE));

/// Integration test for Pi circuit
pub static ref PI_CIRCUIT_TEST: TokioMutex<IntegrationTest<TestPiCircuit::<Fr>>> =
TokioMutex::new(IntegrationTest::new("Pi", PI_CIRCUIT_DEGREE));
/// Integration test for Pi circuit
pub static ref PI_CIRCUIT_TEST: TokioMutex<IntegrationTest<TestPiCircuit::<Fr>>> =
TokioMutex::new(IntegrationTest::new("Pi", PI_CIRCUIT_DEGREE, ROOT_CIRCUIT_SMALL_DEGREE));
}

lazy_static! {
Expand Down Expand Up @@ -239,6 +241,7 @@ fn test_actual_root_circuit<C: Circuit<Fr>>(
pub struct IntegrationTest<C: SubCircuit<Fr> + Circuit<Fr>> {
name: &'static str,
degree: u32,
root_degree: u32,
key: Option<ProvingKey<G1Affine>>,
root_key: Option<ProvingKey<G1Affine>>,
fixed: Option<Vec<Vec<CellValue<Fr>>>>,
Expand All @@ -249,10 +252,11 @@ pub struct IntegrationTest<C: SubCircuit<Fr> + Circuit<Fr>> {
}

impl<C: SubCircuit<Fr> + Circuit<Fr>> IntegrationTest<C> {
fn new(name: &'static str, degree: u32) -> Self {
fn new(name: &'static str, degree: u32, root_degree: u32) -> Self {
Self {
name,
degree,
root_degree,
key: None,
root_key: None,
fixed: None,
Expand Down Expand Up @@ -309,7 +313,7 @@ impl<C: SubCircuit<Fr> + Circuit<Fr>> IntegrationTest<C> {
)
.unwrap();

let general_params = get_general_params(ROOT_CIRCUIT_DEGREE);
let general_params = get_general_params(self.root_degree);
let verifying_key =
keygen_vk(&general_params, &circuit).expect("keygen_vk should not fail");
let key = keygen_pk(&general_params, verifying_key, &circuit)
Expand Down Expand Up @@ -429,16 +433,13 @@ impl<C: SubCircuit<Fr> + Circuit<Fr>> IntegrationTest<C> {
let root_key = self.get_root_key();
let instance = root_circuit.instance();
log::info!("root circuit proof generation");
test_actual_root_circuit(root_circuit, ROOT_CIRCUIT_DEGREE, instance, root_key);
test_actual_root_circuit(root_circuit, self.root_degree, instance, root_key);
} else {
log::info!("root circuit mock prover verification");
// Mock
let mock_prover = MockProver::<Fr>::run(
ROOT_CIRCUIT_DEGREE,
&root_circuit,
root_circuit.instance(),
)
.unwrap();
let mock_prover =
MockProver::<Fr>::run(self.root_degree, &root_circuit, root_circuit.instance())
.unwrap();
self.test_root_variadic(&mock_prover);
mock_prover
.verify_par()
Expand Down

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