Updated unit tests in src/protocols/bdx/tests/ to use PW instead of N…

…L. (#33084)

* Updated unit tests in src/protocols/bdx/tests/ to use PW instead of NL.

* Fixed clang and GN formatting. Moved BDXTests from test_components_nl.txt to test_components.txt.

* Used ASSERT_* in places where tests should be stopped immediately.  Refactored to get rid of else branches that did nothing but ASSERT_TRUE(false).

* Simplified TestBdxTransfersession::SetUpTestSuite as per PR suggestion.

* Undid the accidental reformatting of the comments at the top.

* Semicolon fix.

---------

Co-authored-by: Andrei Litvin <andy314@gmail.com>

src/protocols/bdx/tests/BUILD.gn

@@ -14,11 +14,10 @@
 
 import("//build_overrides/build.gni")
 import("//build_overrides/chip.gni")
-import("//build_overrides/nlunit_test.gni")
+import("//build_overrides/pigweed.gni")
 
 import("${chip_root}/build/chip/chip_test_suite.gni")
-
-chip_test_suite_using_nltest("tests") {
+chip_test_suite("tests") {
   output_name = "libBDXTests"
 
   test_sources = [
@@ -30,9 +29,7 @@ chip_test_suite_using_nltest("tests") {
   public_deps = [
     "${chip_root}/src/lib/core",
     "${chip_root}/src/lib/support",
-    "${chip_root}/src/lib/support:testing_nlunit",
     "${chip_root}/src/protocols/bdx",
-    "${nlunit_test_root}:nlunit-test",
   ]
 
   cflags = [ "-Wconversion" ]

src/protocols/bdx/tests/TestBdxMessages.cpp

@@ -1,11 +1,10 @@
 #include <protocols/bdx/BdxMessages.h>
 
-#include <nlunit-test.h>
+#include <gtest/gtest.h>
 
 #include <lib/support/BufferWriter.h>
 #include <lib/support/CHIPMem.h>
 #include <lib/support/CodeUtils.h>
-#include <lib/support/UnitTestRegistration.h>
 
 #include <limits>
 
@@ -17,29 +16,40 @@ using namespace chip::bdx;
  * is identical to the origianl.
  */
 template <class MsgType>
-void TestHelperWrittenAndParsedMatch(nlTestSuite * inSuite, void * inContext, MsgType & testMsg)
+void TestHelperWrittenAndParsedMatch(MsgType & testMsg)
 {
     CHIP_ERROR err = CHIP_NO_ERROR;
 
     size_t msgSize = testMsg.MessageSize();
     Encoding::LittleEndian::PacketBufferWriter bbuf(System::PacketBufferHandle::New(msgSize));
-    NL_TEST_ASSERT(inSuite, !bbuf.IsNull());
+    ASSERT_FALSE(bbuf.IsNull());
 
     testMsg.WriteToBuffer(bbuf);
-    NL_TEST_ASSERT(inSuite, bbuf.Fit());
+    EXPECT_TRUE(bbuf.Fit());
 
     System::PacketBufferHandle msgBuf = bbuf.Finalize();
-    NL_TEST_ASSERT(inSuite, !msgBuf.IsNull());
+    ASSERT_FALSE(msgBuf.IsNull());
     System::PacketBufferHandle rcvBuf = System::PacketBufferHandle::NewWithData(msgBuf->Start(), msgSize);
-    NL_TEST_ASSERT(inSuite, !rcvBuf.IsNull());
+    ASSERT_FALSE(rcvBuf.IsNull());
 
     MsgType testMsgRcvd;
     err = testMsgRcvd.Parse(std::move(rcvBuf));
-    NL_TEST_ASSERT(inSuite, err == CHIP_NO_ERROR);
-    NL_TEST_ASSERT(inSuite, testMsgRcvd == testMsg);
+    EXPECT_EQ(err, CHIP_NO_ERROR);
+    EXPECT_EQ(testMsgRcvd, testMsg);
 }
 
-void TestTransferInitMessage(nlTestSuite * inSuite, void * inContext)
+struct TestBdxMessages : public ::testing::Test
+{
+    static void SetUpTestSuite()
+    {
+        CHIP_ERROR error = chip::Platform::MemoryInit();
+        ASSERT_EQ(error, CHIP_NO_ERROR);
+    }
+
+    static void TearDownTestSuite() { chip::Platform::MemoryShutdown(); }
+};
+
+TEST_F(TestBdxMessages, TestTransferInitMessage)
 {
     TransferInit testMsg;
 
@@ -60,10 +70,10 @@ void TestTransferInitMessage(nlTestSuite * inSuite, void * inContext)
     testMsg.MetadataLength = 5;
     testMsg.Metadata       = reinterpret_cast<uint8_t *>(fakeData);
 
-    TestHelperWrittenAndParsedMatch<TransferInit>(inSuite, inContext, testMsg);
+    TestHelperWrittenAndParsedMatch<TransferInit>(testMsg);
 }
 
-void TestSendAcceptMessage(nlTestSuite * inSuite, void * inContext)
+TEST_F(TestBdxMessages, TestSendAcceptMessage)
 {
     SendAccept testMsg;
 
@@ -75,10 +85,10 @@ void TestSendAcceptMessage(nlTestSuite * inSuite, void * inContext)
     testMsg.MetadataLength = 5;
     testMsg.Metadata       = reinterpret_cast<uint8_t *>(fakeData);
 
-    TestHelperWrittenAndParsedMatch<SendAccept>(inSuite, inContext, testMsg);
+    TestHelperWrittenAndParsedMatch<SendAccept>(testMsg);
 }
 
-void TestReceiveAcceptMessage(nlTestSuite * inSuite, void * inContext)
+TEST_F(TestBdxMessages, TestReceiveAcceptMessage)
 {
     ReceiveAccept testMsg;
 
@@ -95,19 +105,19 @@ void TestReceiveAcceptMessage(nlTestSuite * inSuite, void * inContext)
     testMsg.MetadataLength = 5;
     testMsg.Metadata       = reinterpret_cast<uint8_t *>(fakeData);
 
-    TestHelperWrittenAndParsedMatch<ReceiveAccept>(inSuite, inContext, testMsg);
+    TestHelperWrittenAndParsedMatch<ReceiveAccept>(testMsg);
 }
 
-void TestCounterMessage(nlTestSuite * inSuite, void * inContext)
+TEST_F(TestBdxMessages, TestCounterMessage)
 {
     CounterMessage testMsg;
 
     testMsg.BlockCounter = 4;
 
-    TestHelperWrittenAndParsedMatch<CounterMessage>(inSuite, inContext, testMsg);
+    TestHelperWrittenAndParsedMatch<CounterMessage>(testMsg);
 }
 
-void TestDataBlockMessage(nlTestSuite * inSuite, void * inContext)
+TEST_F(TestBdxMessages, TestDataBlockMessage)
 {
     DataBlock testMsg;
 
@@ -116,77 +126,15 @@ void TestDataBlockMessage(nlTestSuite * inSuite, void * inContext)
     testMsg.DataLength   = 5;
     testMsg.Data         = reinterpret_cast<uint8_t *>(fakeData);
 
-    TestHelperWrittenAndParsedMatch<DataBlock>(inSuite, inContext, testMsg);
+    TestHelperWrittenAndParsedMatch<DataBlock>(testMsg);
 }
 
-void TestBlockQueryWithSkipMessage(nlTestSuite * inSuite, void * inContext)
+TEST_F(TestBdxMessages, TestBlockQueryWithSkipMessage)
 {
     BlockQueryWithSkip testMsg;
 
     testMsg.BlockCounter = 5;
     testMsg.BytesToSkip  = 16;
 
-    TestHelperWrittenAndParsedMatch<BlockQueryWithSkip>(inSuite, inContext, testMsg);
-}
-
-// Test Suite
-
-/**
- *  Test Suite that lists all the test functions.
- */
-// clang-format off
-static const nlTest sTests[] =
-{
-    NL_TEST_DEF("TestTransferInitMessage", TestTransferInitMessage),
-    NL_TEST_DEF("TestSendAcceptMessage", TestSendAcceptMessage),
-    NL_TEST_DEF("TestReceiveAcceptMessage", TestReceiveAcceptMessage),
-    NL_TEST_DEF("TestCounterMessage", TestCounterMessage),
-    NL_TEST_DEF("TestDataBlockMessage", TestDataBlockMessage),
-    NL_TEST_DEF("TestBlockQueryWithSkipMessage", TestBlockQueryWithSkipMessage),
-
-    NL_TEST_SENTINEL()
-};
-// clang-format on
-
-/**
- *  Set up the test suite.
- */
-static int TestSetup(void * inContext)
-{
-    CHIP_ERROR error = chip::Platform::MemoryInit();
-    if (error != CHIP_NO_ERROR)
-        return FAILURE;
-    return SUCCESS;
-}
-
-/**
- *  Tear down the test suite.
- */
-static int TestTeardown(void * inContext)
-{
-    chip::Platform::MemoryShutdown();
-    return SUCCESS;
+    TestHelperWrittenAndParsedMatch<BlockQueryWithSkip>(testMsg);
 }
-
-// clang-format off
-static nlTestSuite sSuite =
-{
-    "Test-CHIP-BdxMessages",
-    &sTests[0],
-    TestSetup,
-    TestTeardown,
-};
-// clang-format on
-
-/**
- *  Main
- */
-int TestBdxMessages()
-{
-    // Run test suit against one context
-    nlTestRunner(&sSuite, nullptr);
-
-    return (nlTestRunnerStats(&sSuite));
-}
-
-CHIP_REGISTER_TEST_SUITE(TestBdxMessages)