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getting same results (bulk A/R/T) for full RT, analytical RT, and TMM…
… (planar)
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Analytical ray-tracing | ||
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For the most common surface texture used in simulating silicon solar cells, regular pyramids | ||
with an opening angle around 54 degrees, light at normal incidence will always have at | ||
most two reflections from the front surface; the ray may enter the bulk after the first | ||
interaction, or reflect and hit the opposite face of on adjacent pyramid. The ray may | ||
then again enter the bulk, or reflect; if it reflects, it will leave the surface and cannot | ||
hit another pyramids. This simplies the ray-tracing problem significantly, and we can | ||
run an analytical calculation (also for off-normal incidence, as long as the maximum number | ||
of interactions is known in advance on is the same for each ray, regardless of where on the | ||
unit cell the ray first hits). For upright pyramids, the following table summarises regimes | ||
where the maximum number of interactions is the same for all rays: | ||
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Treatment of polarization in ray-tracing | ||
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Note: the below applied to RayFlare version 2.0.0 (August 2024) and later. Prior to this, | ||
the polarization could be set to 's', 'p' or 'u' (unpolarized), with unpolarized light being | ||
an equal mixture of *s* and *p*. While results for pure *s* or *p* | ||
polarization are unchanged between the current version and earlier version, the treatment | ||
for unpolarized light in previous versions was not rigorous, as it was assumed that an initially | ||
unpolarized would remain an equal mixture of *s* and *p* through the ray-tracing procedure. For non-normal incidence, | ||
the reflectance of s and p polarized light is not the same, and thus the ratio *s*:*p*-polarized light will change | ||
each time a ray interacts with a surface. | ||
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