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mixed-type-data-classification

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Wafers-Defect-Recognition-using-Visual-Transformer

PanithanS / Wafers-Defect-Recognition-using-Visual-Transformer

We use MixedWM38, the mixed-type wafer defect pattern dataset for wafer defect pattern regcognition with visual transformers.

machine-learning computer-vision data-analysis pattern-recognition lithography multilabel-classification semiconductor-manufacturing wafermap defect-detection visual-transformer defect-classification yeild wafer-defects yeild-opimization mixed-type-data-classification mixedwm38

Updated Oct 1, 2023
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