FAN (fan-out-oriented) ATPG (Automatic Test Pattern Generation) and Fault Simulation command line tool

2023 VLSI Testing Final Project

Algorithm for generating test pattern for fault detection.

This project focuses on chip orientation estimation using computer vision techniques in a VLSI testing environment. The provided Python script uses OpenCV to create a bounding box around objects in a given image and returns the angular offset of the objects with notations.