Enable i2s HIL test for esp32h2
#1755
Merged
Conversation
This file contains bidirectional Unicode text that may be interpreted or compiled differently than what appears below. To review, open the file in an editor that reveals hidden Unicode characters.
Learn more about bidirectional Unicode characters
Delete invalid comment
24 tasks
Sign up for free
to join this conversation on GitHub.
Already have an account?
Sign in to comment
Add this suggestion to a batch that can be applied as a single commit.
This suggestion is invalid because no changes were made to the code.
Suggestions cannot be applied while the pull request is closed.
Suggestions cannot be applied while viewing a subset of changes.
Only one suggestion per line can be applied in a batch.
Add this suggestion to a batch that can be applied as a single commit.
Applying suggestions on deleted lines is not supported.
You must change the existing code in this line in order to create a valid suggestion.
Outdated suggestions cannot be applied.
This suggestion has been applied or marked resolved.
Suggestions cannot be applied from pending reviews.
Suggestions cannot be applied on multi-line comments.
Suggestions cannot be applied while the pull request is queued to merge.
Suggestion cannot be applied right now. Please check back later.
Pull Request Details 📖
Description
Since #1637 is not an issue anymore and
I2SHIL test runs perfect onESP32H2, we should enable the aforementioned test for this chip.Testing
Executed it locally, did a comparison between current state of
esp-haland on #1635 PR, whenI2Stest was added. Works faster (was ~1 min, 2 seconds now). Logic Analyzer also doesn't show any anomalies.Also for more context check related issue #1637