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HardwareTestCharacterization

Joe Britton edited this page Feb 21, 2017 · 9 revisions

Very rough, feel free to edit/tidy up! Discuss testing ideas in Issue #117. Create new Issues as needed and apply Label area:testing.

Post results of tests here when completed (eventually, we'll move this into a documentation page)

0.1 (proto round 1)

Thermal

  • Check temperature of SFP in PCB_Sayma_AMC and PCB_Metlino operating at 10 Gbps. Discussed in #158.

Analog

  • Phase noise of the various clocks/parts of the clock distribution network
    • related to #118
  • DAC + ADC SFDR & phase noise
  • Temp dependence of output power/phase
  • Return loss of all RF (inc. clock) inputs/outputs
  • Do unterminated clock outputs from eRTM15 cause problems (see #78)?
  • Crosstalk (intra DAC, inter DAC, intra ADC, inter ADC, ADC-DAC)
  • DAC/ADC offset and its stability

Digital bootstrap/testing

  • AMC

    • JTAG
    • Flash
    • MiSoC, UART
    • DDR3
    • Ethernet
    • DRTIO Clock tree
    • Transcievers
    • DRTIO
    • (I2C)
    • (FMC)
    • (other DRTIO up/downlinks SFP/SATA)
  • RTM

    • AUX FPGA config, clock, xcvr, TTL/SPI pass-through/DRTIO
    • SPI tree
    • DAC clock tree
    • DAC JESD
    • Analog mezzanine configuration
  • RTM backplane

    • baikal test: RFB clock reflection due to unoccupied RTM slots #118
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